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Tektronix Spectrum View: A new approach to frequency domain analysis on oscilloscopes

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Debugging embedded systems often involves looking for clues that are hard to discover just by looking at one domain at a time. The ability to look at time and frequency domains simultaneously can offer important insights. Mixed domain analysis is especially useful for answering questions such as:

– What’s going on with my power rail voltage when I’m transmitting wireless data?
– Where are the emissions coming from every time I access memory?
– How long does it take for my PLL to stabilize after power-on?

To address this need, the 4, 5 and 6 Series MSO mixed signal oscilloscopes offer an analysis tool called Spectrum View. It is an option in the 4 Series MSO and a standard feature in the 5 and 6 Series MSOs

Spectrum view delivers several key capabilities:
– Enables the use of familiar spectrum analysis controls (Center Frequency, Span and RBW)
– Allows optimization of both time domain and frequency domain displays independently
– Enables a signal to be viewed in both a waveform view and a spectrum view without splitting the signal into different inputs
– Enables accurate correlation of time domain events and frequency domain measurements (and vice versa)
– Significantly improves achievable frequency resolution in the frequency domain
– Improves the update rate of the spectrum display

Download App Note Spectrum View

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